SEM Testing in Vadodara: Scanning Electron Microscope (SEM+EDS) Facility

Scanning Electron Microscopy (SEM) has become one of the most powerful tools for analysing materials at micro and nano scales. In Vadodara, a state-of-the-art SEM + EDS facility offers advanced surface imaging and elemental analysis for industries, researchers, startups, and quality control laboratories.

This high-precision system enables users to examine surface morphology, particle size, coating integrity, and elemental composition with exceptional clarity and accuracy

A Scanning Electron Microscope (SEM) is an advanced imaging instrument that uses a focused electron beam instead of light to examine a material’s surface. Because electrons have much smaller wavelengths than visible light, SEM can magnify samples to extremely high resolutions, revealing microscopic details invisible to optical microscopes.

When combined with Energy Dispersive Spectroscopy (EDS), the system not only shows how a surface looks but also tells what it is made of.

In simple terms:

• SEM = Structure and surface details
• EDS = Chemical composition and purity verification

The SEM system available in Vadodara is a Japan-imported, high-performance instrument valued at approximately ₹1.9 crore. It is one of the most frequently used instruments at the centre, analysing hundreds of samples annually.

Core Capabilities:

• High-resolution surface imaging
• Live elemental mapping: Provides real-time, simultaneous analysis of surface morphology and elemental composition using Energy Dispersive X-ray Spectroscopy (EDS)
• Morphology analysis (shape, size, texture, particle distribution)
• Elemental composition verification
• Material purity testing
• Elemental mapping (on request)
• Multi-angle image capture

Each sample typically receives:

• 8 SEM images from different magnifications and orientations
• 2 EDS spectra for elemental analysis
• Optional elemental mapping report

The SEM facility supports a wide range of materials, including:

• Metal powders (e.g., titanium, zinc oxide, silver composites)
• Polymers and plastics
• Pharmaceutical samples
• Battery materials
• Thin films and coatings
• Biological materials (hair, teeth, etc.)
• Industrial components

Samples can be solid, liquid, or semi-solid, but liquids and semi-solids must be dried before analysis.

Proper sample preparation is critical to obtaining accurate SEM results.

Here are the key preparation steps:

Samples are dried at controlled temperatures (30–40°C).

Samples are placed on standard discs (50 mm or 125 mm).

Non-conductive samples are coated with a thin layer of gold to make a sample conductive for electron ejection. This process prevents charge build up during non-conductive sample analysis.

The gold coating thickness can be customised based on sample requirements.

• Carbon tape for solid samples
• Copper tape for liquid or semi solid samples.

● Clear imaging
● Accurate elemental detection
● No sample damage

Before high-resolution imaging can begin, the SEM first establishes a stable vacuum environment and then generates and precisely focuses an electron beam onto the sample surface.

The instrument requires approximately 5 minutes to create a vacuum before operation.

A tungsten filament acts as the electron source. The beam is focused onto the sample using the condenser and objective lenses.

• SEM imaging distance: ~5 mm
• EDS analysis distance: ~10 mm

• Solids: 5–30 kV
• Liquids/Semi-solids: 3–15 kV

Higher power improves resolution, but excessive voltage may damage sensitive samples.

• 8 images per sample
• Multiple magnification levels (30 µm, 10 µm, 5 µm common ranges)
• 1 minute 10 seconds per image
• Auto-focus
• Auto-image
• Adjustable brightness and exposure
• Spot intensity control

EDS works alongside SEM to detect X-rays emitted by elements in the sample.

The output includes:

• Element identification
• Elemental percentage composition
• Purity verification
• Spectral peaks representing different elements

For example, metal powders can be verified for contamination or composition accuracy before industrial application.

Turnaround Time

• SEM analysis: ~45 minutes per sample
• SEM + EDS analysis: ~60 minutes per sample
• Standard report delivery: 10 working days
• Urgent cases: Possible within 1 day (limited images)

The SEM chamber must remain closed during operation to prevent atmospheric contamination. Temperature and humidity are carefully managed to maintain consistent imaging conditions. Proper stage motion and centre placement are critical to avoid image distortion or sample damage.

• Surface defect detection
• Failure analysis
• Coating inspection

• Particle size distribution
• Morphology analysis
• Contamination detection

• Electrode structure analysis
• Material purity verification

• Micro-crack detection
• Wear surface examination

• Surface structure validation
• Dispersion studies

• Non-destructive analysis
• High magnification imaging
• Accurate elemental composition
• Reliable and repeatable results
• Digital output suitable for reports and publications

The facility combines advanced instrumentation with trained technical staff to ensure professional-grade analysis and reliable data interpretation.

SEM testing in Vadodara provides industries and innovators with access to advanced surface imaging and elemental analysis through a high-performance SEM + EDS system.

From microstructural analysis to purity verification, the facility enables precise material characterisation essential for product development, quality control, research validation, and failure investigation.

By combining state-of-the-art equipment, standardised preparation procedures, and expert operation, the SEM + EDS facility is a reliable destination for high-accuracy micro- and nanoscale analysis.